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IEEE Transactions on Pattern Analysis and Machine Intelligence—Apr 2008 (Vol. 30, No. 4)

Table of Contents

Front Covers




Introduction of New Associate Editors
David J. Kriegman, David Fleet, Zoubin Ghahramani

Regular Papers

Robust Radiometric Calibration and Vignetting Correction
Seon Joo Kim, Marc Pollefeys

Border and SurfaceTracing—Theoretical Foundations
Valentin E. Brimkov, Reinhard Klette

Geometric Rectification of Camera-Captured Document Images
Jian Liang, Daniel DeMenthon, David Doermann

Maximum Confidence Hidden Markov Modeling for Face Recognition
Jen-Tzung Chien, Chih-Pin Liao

Image Stitching Using Structure Deformation
Jiaya Jia, Chi-Keung Tang

MAC: Magnetostatic Active Contour Model
Xianghua Xie, Majid Mirmehdi

Bayes Optimality in Linear Discriminant Analysis
Onur C. Hamsici, Aleix M. Martinez

Between Classification-Error Approximation and Weighted Least-Squares Learning
Kar-Ann Toh, How-Lung Eng

Dependent Multiple Cue Integration for Robust Tracking
Francesc Moreno-Noguer, Alberto Sanfeliu, Dimitris Samaras

Hole Filling of a 3D Model by Flipping Signs of a Signed Distance Field in Adaptive Resolution
Ryusuke Sagawa, Katsushi Ikeuchi

Unsupervised Learning of Discriminative Edge Measures for Vehicle Matching between Nonoverlapping Cameras
Ying Shan, Harpreet S. Sawhney

Scene Classification Using a Hybrid Generative/Discriminative Approach
Anna Bosch, Andrew Zisserman, Xavier Muñoz

Short Papers

An Improved Physically-Based Method for Geometric Restoration of Distorted Document Images
Li Zhang, Yu Zhang

Error-Dependency Relationships for the Naïve Bayes Classifier with Binary Features
Ludmila I. Kuncheva

A Rich Discrete Labeling Scheme for Line Drawings of Curved Objects
Martin C. Cooper

Robust Foreground Detection in Video Using Pixel Layers
Kedar A. Patwardhan, Guillermo Sapiro, Vassilios Morellas


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